1.

Conference Proceedings
Conference Proceedings
1. Hot-carrier-induced degradation and lifetime prediction in off-state operation of deep submicron SOI n-MOSFETs
Renn, S.H. ; Pelloie, J.L. ; Balestra, F.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.283-288,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
2.

Conference Proceedings
Conference Proceedings
2. High frequency performances of a SOI technology for low power, low voltage applications
Ferlet-Cavrois, V. ; Marcandella, C. ; Pelloie, J.L. ; Raynaud, C. ; Faynot, O.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.373-377,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
3.

Conference Proceedings
Conference Proceedings
3. Impact of the Floating Body Induced Parasitic Bipolar Transistor on Hot-Carrier Effects in 0.1 μm N-Channel SOI MOSFETs
Renn, S.H. ; Pauly, E. ; Pelloie, J.L. ; Balestra, F.
Pub. info.: Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity.  pp.199-206,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-2
4.

Conference Proceedings
Conference Proceedings
4. Physical and electrical properties of fully-depleted SOI devices
Pelloie, J.L. ; Sun, Y.S.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.263-277,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11