1.

Conference Proceedings
Conference Proceedings
1. RESIDUAL STRAIN AND DEFECT ANALYSIS IN AS-GROWN AND ANNEALED SiGe LAYERS
Powell, A.R. ; Kubiak, R.A. ; Whall, T.E. ; Parker, E.H.C. ; Bowen, D.K.
Pub. info.: Silicon molecular beam epitaxy : symposium held April 29-May 3, 1991, Anaheim, California, U.S.A..  pp.277-284,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 220
2.

Conference Proceedings
Conference Proceedings
2. THE “COMPUTER-AIDED EPITAXY” Si:MBE-CONTROL SYSTEM
Kubiak, R.A. ; Newsted, S.M. ; Powell, A.R. ; Bowen, D.K. ; Dowsett, M.G. ; Whall, T.E. ; Parker, E.H.C.
Pub. info.: Silicon molecular beam epitaxy : symposium held April 29-May 3, 1991, Anaheim, California, U.S.A..  pp.55-62,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 220
3.

Conference Proceedings
Conference Proceedings
3. Synthesis of a buried oxide in related Si0.5Ge0.5 material using high energy oxygen implantation
Zhang, J.P. ; Hemment, P.L.F. ; Newstead, S.M. ; Powell, A.R. ; Whall, T.E. ; Parker, E.H.C.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.44-49,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11