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Conference Proceedings

1. THERMAL DEGRADATION OF SiGe INTERFACES STUDIED BY X-RAY REFLECTIVITY AND DIFFRACTION

Hudson, , J. M. ; Powell, A. R. ; Bowen, D. K. ; Wormington, M. ; Tanner, B. K. ; Kubiak, R. A. ; Parker, E. H. C.

Pub. info.:	Thin films : stresses and mechanical properties III : symposium held December 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.455-460, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	239

Conference Proceedings

2. FORMATION ON GERMANIUM DIOXIDE DURING WET OXIDATION OF Si0.5Ge0.5 ALLOY

Zhang, J. P. ; Hemment, P. L. F. ; Kubiak, R. A. ; Parker, E. H. C.

Pub. info.:	Growth, processing, and characterization of semiconductor heterostructures : Symposium held November 29-December 2, 1993, Massachusetts, U.S.A.. pp.73-, 1994. Pittsburgh. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	326

Conference Proceedings

3. (4.25) 8:37 - 8:40 PM - Low Frequency Noise Mechanisms in Si and Pseudomorphic SiGe p-Channel Field-Effect Transistors

Prest, M. J. ; Fulgoni, D. J. F. ; Bacon, A. R. ; Grasby, T. J. ; Parker, E. H. C. ; Whall, T. E. (U. Warwick)

Pub. info.:	SiGe: materials, processing, and devices : proceedings of the First international symposium. pp.327-334, 2004. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2004-07

Conference Proceedings

4. Energy-Loss Filtered Imaging of Segregation-Induced Interface Broadening in SiGe/Si p-Channel MOSFET Device Structures

Cullis, A. G. ; Grasby, T. J. ; Norris, D. J. ; Parker, E. H. C.

Pub. info.:	Advances in materials problem solving with the electron microscope : symposium held November 30-December 3, 1999, Boston, Massachusetts, U.S.A.. pp.167-172, 2001. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	589