1.

Conference Proceedings

Conference Proceedings
Lee, T.S. ; Jeoung, Y.T. ; Kim, H.K. ; Kim, J.M. ; Song, J.H. ; Ann, S.Y. ; Lee, J.Y. ; Kim, Y.H. ; Kim, S.U. ; Park, M.J. ; Lee, S.D. ; Suh, S.H.
Pub. info.: Infrared technology and applications XXIV : 19-24 July 1998, San Diego, California.  Part 1  pp.67-71,  1998.  Bellingham, Wash., USA.  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3436
2.

Conference Proceedings

Conference Proceedings
Song, J.H. ; Kim, J.S. ; Jung, K.U. ; Suh, S.H. ; Kim, S.U. ; Park, M.J.
Pub. info.: Infrared technology and applications XXIV : 19-24 July 1998, San Diego, California.  Part 1  pp.34-40,  1998.  Bellingham, Wash., USA.  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3436
3.

Conference Proceedings

Conference Proceedings
Lee, C.H. ; Choi, J.B. ; Yook, J.S. ; Lee, S.J. ; Park, K.W. ; Bae, S.H. ; Lee, H.C. ; Kim, C.K. ; Kang, T.W. ; Hong, J.K. ; Kim, S.U. ; Park, M.J.
Pub. info.: Infrared technology and applications XXIV : 19-24 July 1998, San Diego, California.  Part 1  pp.62-66,  1998.  Bellingham, Wash., USA.  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3436
4.

Conference Proceedings

Conference Proceedings
Hong, J.K. ; Chung, Y.C. ; Kim, I.J. ; Shin, D.Y. ; Kim, E.S. ; Choi, I.S. ; Kim, K.H. ; Song, Y.T. ; Shim, J.C. ; Kim, Y.H. ; Oh, K.N. ; Hong, S.K. ; Kim, S.U. ; Park, M.J. ; Jeon, S.S.
Pub. info.: Infrared technology and applications XXIV : 19-24 July 1998, San Diego, California.  Part 1  pp.10-15,  1998.  Bellingham, Wash., USA.  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3436
5.

Conference Proceedings

Conference Proceedings
Choi, S.S. ; Jung, M.Y. ; Song, M.S. ; Park, M.J. ; Kim, D.W.
Pub. info.: Nanomanipulation with Light.  pp.105-110,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5736