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13 results

Conference Proceedings

1. MEMS/MOEMS for lightwave networks: Can little machines make it big?

Bishop,D.J. ; Aksyuk,V.A. ; Bolle,C.A. ; Giles,C.R. ; Pardo,F. ; Walker,J.A.

Pub. info.:	Micromachining and microfabrication process technology VI : 18-20 September 2000, Santa Clara, USA. pp.2-5, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4174

Conference Proceedings

2. Design for reliability of MEMS/MOEMS for lightwave telecommunications

Arney,S. ; Aksyuk,V.A. ; Bishop,D.J. ; Bolle,C.A. ; Frahm,R.E. ; Gasparyan,A. ; Giles,C.R. ; Goyal,S. ; Pardo,F. ; Shea,H.R. ; Lin,M.T. ; White,C.D.

Pub. info.:	Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001, San Trancisco, USA. pp.6-10, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4558

Conference Proceedings

3. Stress-induced curvature engineering in surface-micromachined devices

Aksyuk,V.A. ; Pardo,F. ; Bishop,D.J.

Pub. info.:	Design, test, and microfabrication of MEMS and MOEMS : 30 March-1 April 1999, Paris, France. Part2 pp.984-993, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3680

Conference Proceedings

4. Lucent Microstar micromirror array technology for large optical crossconnects

Aksyuk,V.A. ; Pardo,F. ; Bolle,C.A. ; Arney,S.C. ; Giles,C.R. ; Bishop,D.J.

Pub. info.:	MOEMS and miniaturized systems : 18-20 September 2000, Santa Clara, USA. pp.320-324, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4178

Conference Proceedings

5. MEMS/MOEMS for lightwave networks: can little machines make it big?

Bishop,D.J. ; Aksyuk,V.A. ; Bolle,C.A. ; Giles,C.R. ; Pardo,F. ; Walker,J.A.

Pub. info.:	MOEMS and miniaturized systems : 18-20 September 2000, Santa Clara, USA. pp.2-5, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4178

Conference Proceedings

6. MEMS/MOEMS for lightwave networks: Can little machines make it big?

Bishop,D.J. ; Aksyuk,V.A. ; Bolle,C.A. ; Giles,C.R. ; Pardo,F. ; Walker,J.A.

Pub. info.:	Micromachining technology for micro-optics : 20 September 2000, Santa Clara, USA. pp.2-5, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4179

Conference Proceedings

7. Design issues on CMOS space-variant image sensors

Pardo,F. ; Boluda,J.A. ; Perez,J.J. ; Dierickx,B. ; Scheffer,D.

Pub. info.:	Advanced focal plane arrays and electronic cameras : 9-10 October 1996, Berlin, FRG. pp.98-107, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2950

Conference Proceedings

8. Log polar image sensor in CMOS technology

Scheffer,D. ; Dierickx,B. ; Pardo,F. ; Vlummens,J. ; Meynants,G. ; Hermans,L.

Pub. info.:	Vision systems--sensors, sensor systems, and components : 10-12 June 1996, Besançon, France. pp.2-11, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2784

Conference Proceedings

9. Electrical and environmental reliability characterization of surface-micromachined MEMS polysilicon test structures

White,C.D. ; Shea,H.R. ; Cameron,K.K. ; Pardo,F. ; Bolle,C.A. ; Aksyuk,V.A. ; Arney,S.C.

Pub. info.:	MEMS Reliability for Critical Applications. pp.91-95, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4180

10.

Conference Proceedings

10. MEMS/MOEMS for lightwave networks: can little machines make it big?

Bishop,D.J. ; Aksyuk,V.A. ; Bolle,C.A. ; Giles,C.R. ; Pardo,F. ; Walker,J.A.

Pub. info.:	MEMS Reliability for Critical Applications. pp.2-5, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4180

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Author: Pardo,F.