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19 results

Conference Proceedings

1. MIRAGE: system overview and status

Oleson,J. ; Sparkman,K. ; Irwin,A. ; Rubin,L. ; McHugh,S.W. ; Gallagher,A.M. ; Lin,W. ; Pan,J. ; Solomon,S.L.

Pub. info.:	Technologies for synthetic environments : hardware-in-the-loop testing VI : 16-18 April 2001, Orlando, USA. pp.112-120, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4366

Conference Proceedings

2. Performance evaluation of the GA/SA hybrid heuristic optimum filter for optical pattern recognition

Yeun,J.S. ; Kim,N. ; Pan,J. ; Kim,R.S. ; Um,J.U. ; Kim,S.H.

Pub. info.:	Applications of artificial neural networks in image processing II : 12-13 February, 1997, San Jose, California. pp.109-114, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3030

Conference Proceedings

3. Photogeneration in a ladder-type poly(para-phenylene)

Pan,J. ; Schreiber,A. ; Bilke,R. ; Forster,M. ; Scherf,U. ; Haarer,D.

Pub. info.:	Organic photorefractives, photoreceptors, waveguides, and fibers : 21-23 July 1999, Denver, Colorado. pp.161-167, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3799

Conference Proceedings

4. New method of two-color calibration and one-color measurement for real-time inspection of temperature field

Zhang,H. ; Pan,J. ; Wang,H.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.498-504, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

Conference Proceedings

5. MIRAGE emitter improvements and technology review

Solomon,S.L. ; Irwin,A. ; Oleson,J. ; Sparkman,K. ; Gallagher,A.M. ; Lin,W. ; Pan,J.

Pub. info.:	Technologies for synthetic environments : hardware-in-the-loop testing VI : 16-18 April 2001, Orlando, USA. pp.510-518, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4366

Conference Proceedings

6. Real-time measurement of temperature field by colorimetric method

Zhang,H. ; Liao,B. ; Pan,J.

Pub. info.:	Detectors, focal plane arrays, and applications : 4-5 November 1996, Beijing, China. pp.11-18, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2894

Conference Proceedings

7. Compensator for even high-order aspheric surfaces

Pan,J. ; Li,X.

Pub. info.:	Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China. pp.36-38, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4231

Conference Proceedings

8. Manufacturing of the Φ500-mm F/2 ellipsoid mirror

Li,X. ; Pan,J. ; Liu,X. ; Yuan,L. ; Xia,Z.

Pub. info.:	Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China. pp.456-459, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4231

Conference Proceedings

9. Picosecond optical sampling method to measure S-parameter of microwave monolithic integrated circuit

Lu,F. ; Yuan,S. ; Pan,J. ; Gai,Q. ; Zhao,Y. ; He,Q.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.595-600, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

10.

Conference Proceedings

10. EIS Study of High-Temperature Oxide Films on a Stainless Steel(253MA)-Influence of Alloying Elements

Pan,J. ; Leygraf,C. ; Otsuka,T. ; Jargelius-Pettersson,R.F.A. ; Ivarsson,B. ; Linden,J.

Pub. info.:	Electrochemical methods in corrosion research VI : proceedings of the 6th International Symposium on Electrochemical Methods in Corrosion Research (EMCR VI), Trento, Italy, August 25-29, 1997. Part2 pp.1181-1192, 1998. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	289-292

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Author: Pan,J.