1.

Conference Proceedings
Conference Proceedings
1. Correlation of In and Ex Situ Stress to Microstructures during Al-Induced Crystallization of PECVD Amorphous Silicon
Ray, S. ; Lian, Y.G. ; Shiram, V. ; Tucker, D.J. ; Pan, G.Z.
Pub. info.: Amorphous and nanocrystalline silicon science and technology - 2005 : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.245-250,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 862
2.

Conference Proceedings
Conference Proceedings
2. Silicon Light Emissions from Boron Implant-Induced Extended Defects
Pan, G.Z. ; Ostroumov, R.P. ; Ren, L.P. ; Lian, Y.G. ; Wang, K.L.
Pub. info.: Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.247-252,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 864
3.

Conference Proceedings
Conference Proceedings
3. Effect of a Ti-capped and Ti-mediated Layer on Co Silicide Formation
Pan, G.Z. ; Chang, E.W. ; Rahmat-Samii, Y.
Pub. info.: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.451-456,  2002.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 716
4.

Conference Proceedings
Conference Proceedings
4. Role of Dose, Dose Rate, and Anneal Temperature on End-of-Range Dislocation Loops
Prussin, S. ; Pan, G.Z. ; Zhang, P.F.
Pub. info.: Proceedings of the Fourth International Symposium on Process Physics and Modeling in Semiconductor Technology.  pp.379-386,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-4