1.

Conference Proceedings
Conference Proceedings
1. The Properties of n-ZnO/p-SiC Heterojunctions and their Potential Applications for Devices
Litton, C.W. ; Alivov, Ya.I. ; Johnstone, D. ; Ozgur, U. ; Avrutin, V.S. ; Fan, Q. ; Akarca-Biyikli, S.S. ; Zhu, K. ; Morkoc, H.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.1571-1574,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
2.

Conference Proceedings
Conference Proceedings
2. Improved Structural Quality and Carrier Decay Times in GaN Epitaxy on SiN and TiN Porous Network Templates
Ozgur, U. ; Litton, C.W. ; Fu, Y. ; Moon, Y.T. ; Yun, F. ; Everitt, H.O. ; Morkoc, H.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.1505-1508,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
3.

Conference Proceedings
Conference Proceedings
3. Characterization of GaN epitaxial films grown on SiNx and TiNx porous network templates (Invited Paper) [6121-11]
Xie, J. ; Fu, Y. ; Ozgur, U. ; Moon, Y. T. ; Yun, F. ; Morkoc, H. ; Everitt, H. O. ; Sagar, A. ; Feenstra, R. M. ; Inoki, C. K. ; Kuan, T. S. ; Zhou, L ; Smith D. J
Pub. info.: Gallium Nitride Materials and Devices.  pp.61210B-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6121
4.

Conference Proceedings
Conference Proceedings
4. Ultrafast carrier relaxation in group-III nitride multiple quantum wells
Ozgur, U. ; Everitt, H.O. ; Keller, S. ; DenBaars, S.P. ; He, L. ; Morkoc, H.
Pub. info.: Ultrafast Phenomena in Semiconductors and Nanostructure Materials VIII.  pp.158-168,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5352