1.

Conference Proceedings
Conference Proceedings
1. Independent Determination of the Temperature Factor of a Ga Atom in a GaAs Powder Sample
Uno,R. ; Ozawa,H. ; Ohsumi,K.
Pub. info.: European powder diffraction : EPDIC IV : proceedings of the Fourth European Powder Diffraction Conference, held in Chester, England, July 1995.  pp.571-576,  1996.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 228-231
2.

Conference Proceedings
Conference Proceedings
2. Preflight performance of the ASTRO-E hard-x-ray detector
Tanihata,C. ; Kataoka,J. ; Murakami,T. ; Ota,N. ; Ozawa,H. ; Takahashi,T. ; Tamura,T. ; Uchiyama,Y. ; Watanabe,S. ; Yamaoka,K. ; Yonetoku,D. ; Ezoe,Y. ; Fukazawa,Y. ; Isobe,N. ; Kamae,T. ; Kokubun,M. ; Kotoku,J. ; Kubota,A. ; Makishima,K.
Pub. info.: EUV, x-ray, and gamma-ray instrumentation for astronomy X : 21-23 July 1999 Denver, Colorado.  pp.645-663,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3765
3.

Conference Proceedings
Conference Proceedings
3. Development of the large-area silicon PIN diode with 2-millimeter-thick depletion layer for hard x-ray detector (HXD) on board Astro-E
Sugizaki,M. ; Kubo,S. ; Murakami,T. ; Ota,N. ; Ozawa,H. ; Takahashi,T. ; Kaneda,H. ; Iyomoto,N. ; Kamae,T. ; Kokubun,M. ; Kubota,A. ; Makishima,K. ; Tamura,T. ; Tashiro,M. ; Koyama,K. ; Tsunemi,H.
Pub. info.: Hard X-ray and gamma-ray detector physics, optics, and applications : 31 July-1 August 1997, San Diego, California.  pp.244-253,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3115
4.

Conference Proceedings
Conference Proceedings
4. Integration of the readout electronics for the Astro-E hard x-ray detector
Ozawa,H. ; Kataoka,J. ; Murakami,T. ; Sugizaki,M. ; Takahashi,T. ; Yamaoka,K. ; Ezawa,H. ; Fukazawa,Y. ; Kamae,T. ; Makishima,K. ; Mizuno,T. ; Nakazawa,K. ; Osone,S. ; Ikeda,H. ; Tsukada,K. ; Kubo,H.
Pub. info.: Hard X-ray and gamma-ray detector physics, optics, and applications : 31 July-1 August 1997, San Diego, California.  pp.235-243,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3115