1.

Conference Proceedings
Conference Proceedings
1. Ferroelectric and optical properties in the 180-deg. ferroelectric domain wall of tetragonal BaTiO3
Chaib, H. ; Grafstroem, S. ; Otto, T. ; Eng, L.M.
Pub. info.: Advanced organic and inorganic optical materials : 19-22 August 2002, Riga, Latvia.  pp.358-365,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5122
2.

Conference Proceedings
Conference Proceedings
2. Novel transparent electrodes for electro-optical near-field microscopy
Otto, T. ; Grafstroem, S. ; Seidel, J. ; Eng, L.M.
Pub. info.: Advanced organic and inorganic optical materials : 19-22 August 2002, Riga, Latvia.  pp.366-370,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5122
3.

Conference Proceedings
Conference Proceedings
3. Packaging and characterization of micro-opto-electro-mechanical systems
Saupe, R. ; Otto, T. ; Stock, V. ; Fritzsch, U. ; Gessner, T.
Pub. info.: Microwave and Optical Technology 2003.  pp.152-155,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5445
4.

Conference Proceedings
Conference Proceedings
4. Packaging and characterization of miniaturized spectral sensing devices
Otto, T. ; Saupe, R. ; Stock, V. ; Fritzsch, U. ; Bruch, R.F. ; Gessner, T.
Pub. info.: MOEMS and Miniaturized Systems IV.  pp.134-140,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5346
5.

Conference Proceedings
Conference Proceedings
5. Nanoscale nondestructive electric field probing in ferroelectrics, organic molecular films and near-field optical nanodevices
Eng, L.M. ; Grafstrom, S. ; Hellmann, I. ; Loppacher, C. ; Otto, T. ; Renger, J. ; Schlaphof, F. ; Seidel, J. ; Zerweck, U.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems II.  pp.21-35,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5392
6.

Conference Proceedings
Conference Proceedings
6. A novel dual-detector micro-spectrometer
Otto, T. ; Saupe, R. ; Stock, V. ; Bruch, R. ; Gruska, B. ; Gessner, T.
Pub. info.: MOEMS and Miniaturized Systems V.  pp.76-82,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5719