1.

Conference Proceedings
Conference Proceedings
1. Microstructure of thin films: correlation with laser damage threshold
Ciosek,J. ; Paszkowicz,W. ; Pankowski,P. ; Pelka,J.B. ; Baczewski,L.T. ; Marczak,J. ; Ostrowski,R.
Pub. info.: Optical metrology roadmap for the semiconductor, optical, and data storage industries II : 2-3 August 2001 San Diego, USA.  pp.276-280,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4449
2.

Conference Proceedings
Conference Proceedings
2. Eye-safe Nd:YAG laser
Ostrowski,R. ; Marczak,J. ; Mierczyk,Z.
Pub. info.: Laser technology VI : progress in lasers : 27 September-1 October 1999, Szczecin-Świnoujście, Poland.  pp.166-176,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4237
3.

Conference Proceedings
Conference Proceedings
3. NDE for management of aging infrastructure at the Savannah River site
Cowfer,C.D. ; Ostrowski,R.
Pub. info.: Nondestructive Evaluation of Utilities and Pipelines.  pp.32-40,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2947