1.

Conference Proceedings
Conference Proceedings
1. Integrity of Copper-Tantalum Nitride Metallization Under Different Ambient Conditions
Yap, K.P. ; Gong, H. ; Dai, J.Y. ; Osipowicz, T. ; Chan, L.H. ; Lahiri, S.K.
Pub. info.: Low and High Dielectric Constant Materials : Materials Science, Processing, and Reliability Issues, proceedings of the fourth International Symposium and Thin Film Materials for Advanced Packaging Technologies : proceedings of the second International Symposium.  pp.195-208,  1999.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-7
2.

Conference Proceedings
Conference Proceedings
2. Thermal Studies on Stress-Induced Void-Like Defects in Epitaxial-CoSi2 Formation
Ho, C. S. ; Pey, K. L. ; Tung, C. H. ; Tee, K. C. ; Prasad, K. ; Saigal, D. ; Tan, J. J. L. ; Wong, H. ; Lee, K. H. ; Osipowicz, T. ; Chua, S. J. ; Karunasiri, R. P. G.
Pub. info.: Advanced interconnects and contacts : symposium held April 5-7, 1999, San Francisco, California, U.S.A..  pp.109-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 564
3.

Conference Proceedings
Conference Proceedings
3. Characterization of Ni- and Ni(Pt)-sillicide formation on narrow polycrystalline Si lines by raman spectroscopy
Lee, P. S. ; Mangelinck, D. ; Pey, K. L. ; Ding, J. ; Osipowicz, T. ; Ho, C. S. ; Chen, G. L. ; Chan, L.
Pub. info.: Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A..  pp.269-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 591
4.

Conference Proceedings
Conference Proceedings
4. Formation and Stability of Ni(Pt) Silicide on (100)Si and (111)Si
Mangelinck, D. ; Dai, J. Y. ; Lahiri, S. K. ; Ho, C. S. ; Osipowicz, T.
Pub. info.: Advanced interconnects and contacts : symposium held April 5-7, 1999, San Francisco, California, U.S.A..  pp.163-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 564
5.

Conference Proceedings
Conference Proceedings
5. Thickness Effect On Nickel Silicide Formation And Thermal Stability For Ultra Shallow Junction CMOS
Zhao, F.F. ; Shen, Z.X. ; Zheng, J.Z. ; Gao, W.Z. ; Osipowicz, T. ; Pang, C.H. ; Lee, P.S. ; See, A.K.
Pub. info.: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.41-46,  2002.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 716
6.

Conference Proceedings
Conference Proceedings
6. Yellow Luminescence Imaging Of Epitaxial Lateral Overgrown GaN Using Ionoluminescence
Teo, E.J. ; Bettiol, A.A. ; Osipowicz, T. ; Hao, M.S. ; Chua, S.J. ; Liu, Y.Y.
Pub. info.: Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.85-180,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 738
7.

Conference Proceedings
Conference Proceedings
7. A Study of the Decomposition of GaN During Annealing Over a Wide Range of Temperatures
Rana, M.A. ; Choi, H.W. ; Breese, M.B.H. ; Osipowicz, T. ; Chua, S.J. ; Watt, F.
Pub. info.: GaN and related alloys - 2002 : symposium held December 2-6, Boston, Massachusetts, U.S.A..  pp.731-736,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 743