Doped fiber devices II : 2-3 November, 1998, Boston, Massachusetts. pp.8-17, 1998. Bellingham, Washington. SPIE - The International Society for Optical Engineering
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Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California. pp.258-261, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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