1.

Conference Proceedings
Conference Proceedings
1. Plasma Immersion Ion Implantation of Nitrogen into Porous Silicon Layers
Manuaba,A. ; Pinter,I. ; Szilagyi,E. ; Battistig,G. ; Ortega,C. ; A ; Grosman ; Amsel,G.
Pub. info.: Materials science applications of ion beam techniques : proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, incoeporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 9-12 1996.  pp.233-236,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 248-249
2.

Conference Proceedings
Conference Proceedings
2. Defects in As-Prepared and Thermally Oxydized Porous Silicon
Bardeleben,H.J.von ; Grosman,A. ; Morazzani,V. ; Ortega,C. ; Siejka,J.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1487-1491,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings
Conference Proceedings
3. Electrical Characterization of Surface Defects on Porous p-type Silicon
Cadet,C. ; Deresmes,D. ; Vuillaume,D. ; Stievenard,D. ; Grosman,A. ; Ortega,C. ; Siejka,J. ; Bardeleben,H.J.von
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1475-1480,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
4.

Conference Proceedings
Conference Proceedings
4. Defect and structure analysis of n+and P+-type porous silicon by the Electron Paramagnetic Resonance Technique
von Bardeleben,H.J. ; Stievenard*,D. ; Grosman,A. ; Ortega,C. ; Siejka,J.
Pub. info.: Optical properties of low dimensional silicon structures.  pp.191-196,  1993.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 244
5.

Conference Proceedings
Conference Proceedings
5. Die allocation optimization for yield improvement
Ortega,C. ; Recio,M. ; Urquia,A. ; Sanchez,G. ; Nogal,U. ; Badillo,A.
Pub. info.: Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III.  pp.140-144,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3216
6.

Conference Proceedings
Conference Proceedings
6. Productivity improvement through cycle time analysis
Bonal,J. ; Rios,L. ; Ortega,C. ; Aparicio,S. ; Fernandez,M. ; Rosendo,M. ; Sanchez,A. ; Malvar,S.
Pub. info.: Process, Equipment, and Materials Control in Integrated Circuit Manufacturing II.  pp.57-62,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2876
7.

Conference Proceedings
Conference Proceedings
7. Effect of cycle time and fab yield variation on the number of wafer outs variability: a Monte Carlo case study
Ortega,C. ; Bonal,J. ; Collado,J.C.
Pub. info.: Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III.  pp.82-87,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3216