1.

Conference Proceedings
Conference Proceedings
1. On the Sensitivity of Optical Reflectivity Spectra to the Bulk Defects in Semiconductors-Example of Crystalline Si
Iwanowski,R.J. ; Kowalski,B.J. ; Orlowski,B.A. ; Bak-Misiuk,J.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.183-188,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings
Conference Proceedings
2. Electronic Band Structure of Cubic Hg1-xFexS
Szuszkiewicz,W. ; Guziewicz,E. ; Kowalski,B.J. ; Orlowski,B.A. ; Witkowska,B.
Pub. info.: II-VI compounds and semimagnetic semiconductors : joint proceedings of the Third European Workshop on II-VI Compounds, Linz, Austria, 26-28 September 1994, and the Fourth International Workshop on Semimagnetic (Diluted Magnetic) Semiconductors, Linz, Austria, 26-28 September 1994.  pp.707-710,  1995.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 182-184