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EMLC 2005 : 21st European Mask and Lithography Conference : 31 January-3 February, 2005, Dresden, Germany. pp.29-36, 2005. Bellingham, Wash.,. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Ooishi, K. ; Esaki, Y. ; Sakamoto, K. ; Sakurai, H. ; Itoh, M. ; Nakao, M. ; Nishimura, T. ; Miyashita, H. ; Hayashi, N. ; Tanabe, S. ; Oosaki, Y. ; Sasagawa, Y.
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Photomask and Next-Generation Lithography Mask Technology X. pp.67-77, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Sakurai, H. ; Oppata, Y. ; Murano, K. ; Sakai, M. ; Itoh, M. ; Watanabe, H. ; Funakoshi, H. ; Ooishi, K. ; Okamoto, Y. ; Kaneda, M. ; Kamei, S. ; Hayashi, N.
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Photomask Technology 2006. pp.63494J-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering