1.

Conference Proceedings
Conference Proceedings
1. Size Distribution of Oxide Precipitates Determined by Bright Field Infrared Laser Interferometer(Optical Precipitate Profiler)in Annealed Czochralski Silicon
Sasaki,T. ; Ono,T. ; Rozgonyi,G.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.487-495,  1999.  Pennington, N.J..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3895
2.

Conference Proceedings
Conference Proceedings
2. Precise micronanomachining for advanced sensors (Invited Paper)
Esashi,M. ; Ono,T. ; Minami,K.
Pub. info.: Micromachining and microfabrication process technology III : 29-30 September, 1997, Austin, Texas.  pp.44-55,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3223
3.

Conference Proceedings
Conference Proceedings
3. Local melting with scanning tunneling microscopy and its application: microbonding between silicon and glass at room temperature
Wang,Q. ; Abe,T. ; Ono,T. ; Esashi,M.
Pub. info.: Smart electronics and MEMS II : 13-15 December 2000, Melbourne, Australia.  pp.286-293,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4236
4.

Conference Proceedings
Conference Proceedings
4. Six-Hour Orbit toward West Satellite (SHOWS)
Kikuchi,A. ; Tsuiki,A. ; Aoyama,J.-I. ; Hiramatsu,M. ; Ono,T. ; Ikeda,M.
Pub. info.: Earth observing systems V : 2-4 August 2000, San Diego, USA.  pp.182-191,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4135
5.

Conference Proceedings
Conference Proceedings
5. PANIC(PtSi Astronomical Near-Infrared Camera)in South Africa and its astronomical applications
Tanabe,T. ; Nishida,S. ; Nakada,Y. ; Matsumoto,S. ; Onaka,T. ; Sekiguchi,K. ; Ono,T. ; Glass,I.S. ; Carter,D.B.
Pub. info.: Infrared technology and applications XXII : 8-12 April 1996, Orlando, Florida.  pp.110-114,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2744
6.

Technical Paper
Technical Paper
6. In-Flight Evaluation of Tunnel-in-the-Sky Display and Curved Approach Pattern
Funabiki,K. ; Muraoka,K. ; Terui,Y. ; Harigae,M. ; Ono,T.
Pub. info.: A collection of technical papers : AIAA Guidance, Navigation and Control Conference and Exhibit, Portland, Oregon 9-11 August 1999.  Pt. 1  pp.108-114,  1999.  Reston, VA.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Guidance Navigation and Control Conference
Ser. no.: 1999