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Conference Proceedings

1. High-resolution DUV inspection system for 150-nm generation masks

Tabata,M. ; Tsuchiya,H. ; Sanada,Y. ; Nishizaka,T. ; Hirazawa,H. ; Kobayashi,N. ; Nagai,H. ; Watanabe,T. ; Oohashi,K. ; Inoue,H. ; Nomura,T. ; Ono,A.

Pub. info.:	19th Annual Symposium on Photomask Technology : 15-17 September 1999, Monterey, California. Part1 pp.138-146, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3873

Conference Proceedings

2. Fourier transform spectrometer for thermal-infrared emissivity measurement near room temperatures

Ishii,J. ; Ono,A.

Pub. info.:	Optical diagnostic methods for inorganic transmissive materials II : 3-4 August 2000, San Diego, USA. pp.126-132, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4103

Conference Proceedings

3. Estimation model of net primary production by vegetation for ADEOS-？/GLI data

Furumi,S. ; Ono,A. ; Muramatsu,K. ; Fujiwara,N.

Pub. info.:	Hyperspectral remote sensing of the land and atomosphere : 9-12 October 2000, Sendai, Japan. pp.205-213, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4151

Conference Proceedings

4. Pattern decomposition method for hypermultispectral satellite data analysis

Fujiwara,N. ; Ono,A. ; Daigo,M.

Pub. info.:	Hyperspectral remote sensing of the land and atomosphere : 9-12 October 2000, Sendai, Japan. pp.178-188, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4151

Conference Proceedings

5. Highly efficient operation of diode laser transversely pumped high-power Nd:YAG rod laser

Takada,A. ; Akiyama,Y. ; Takase,T. ; Yoshida,S. ; Yuasa,H. ; Ono,A.

Pub. info.:	Advanced high-power lasers : 1-5 November 1999, Osaka, Japan. pp.216-223, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3889

Conference Proceedings

6. Growth surface dependence of cathodoluminescence of cubie boron nitride

Kanda,H. ; Ono,A. ; Suda,Y. ; Era,K.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part2 pp.1265-1274, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

Conference Proceedings

7. Optical Heterodyne Detection Processes for Obtaining First-Order Correlation and Power Spectrum of Optical Amplitude Fluctuations,

Ono,A. ; Tanaka,S. ; Ohtsuka,Y.

Pub. info.:	Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea. Part1 pp.211-212, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2778

Conference Proceedings

8. High-density parallel optical interconnection for IoTbps interconnection in high-speed memory test systems (Invited Paper) [6124-21]

Okayasu, T. ; Hayase, Y. ; Ono,A. ; Watanabe,D. ; Mori,H. ; Nomura, T.

Pub. info.:	Optoelectronic Integrated Circuits VIII. pp.61240M-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6124

Conference Proceedings

9. Phase measurement using Hg-Xe lamp and KrF excimer laser

Oohashi,K. ; Fujiwara,T. ; Nomura,T. ; Ono,A.

Pub. info.:	16th Annual BACUS Symposium on Photomask Technology and Management. pp.219-226, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2884

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Conference Proceedings

10. Newly developed mask inspection system with DUV laser illumination

Oohashi,K. ; Inoue,H. ; Nomura,T. ; Ono,A. ; Tabata,M. ; Suzuki,H.

Pub. info.:	Photomask and Next-Generation Lithography Mask Technology VII. pp.452-461, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4066

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Author: Ono,A.