1.

Conference Proceedings
Conference Proceedings
1. Decision uncertainty in a structural health monitoring system
DeSimio, M. ; Olson, S. ; Derriso, M.
Pub. info.: Smart structures and materials 2005 : Smart structures and integrated system : 7-10 March 2005, San Diego, California, USA.  pp.530-541,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5764
2.

Conference Proceedings
Conference Proceedings
2. An Innovative Planarization Technology For Ultra High Frequency InP/InGaAs Heterojunction Bipolar Transistor (HBT) Manufacturing
Chang, X. Zeng P.C. ; Yamamoto, J. ; Sawdai, D. ; Gutierrez-Aitken, A. ; Barsky, M. ; Olson, S. ; Oki, A.
Pub. info.: State-of-the-art program on compound semiconductors XLI and nitride and wide bandgap semiconductors for sensors, photonics, and electronics V : proceedings of the international symposia.  pp.44-50,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-06
3.

Technical Paper
Technical Paper
3. Sea Launchsm payload fairing separation system
Boucher, C. ; Olson, S.
Pub. info.: AIAA paper.  pp.2-14,  1997.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.: 1997
4.

Conference Proceedings
Conference Proceedings
4. Fabrication of cantilever probes with integrated piezoresistive read-out and built-in piezoelectric actuators
Olson, S. ; Altemus, B. ; Sankaran, B. ; Tokranova, N. ; Geer, R. ; Castracane, J. ; Xu, B.
Pub. info.: MEMS/MOEMS Components and Their Applications II.  pp.167-174,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5717
5.

Conference Proceedings
Conference Proceedings
5. Integrated cantilever fabrication and system development for ultrasonic and acoustic scanning probe microscopy
Olson, S. ; Sankaran, B. ; Altemus, B. ; Xu, B. ; Geer, R.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems III.  pp.159-167,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5766