Polarization analysis, measurement, and remote sensing IV : 29-31 July 2001, San Diego, USA. pp.163-174, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Photon migration, optical coherence tomography, and microscopy : 18-21 June 2001, Munich, Germany. pp.352-353, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing VIII. pp.81-91, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering