1.

Conference Proceedings

Conference Proceedings
Suzuki, Y-I. ; Fukui, H. ; Tsuchiya, K. ; Arita, S. ; Ogata, Y.H.
Pub. info.: Scanning probe techniques for materials characterization at nanometer scale : proceedings of the International Symposium.  pp.168-177,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-35
2.

Conference Proceedings

Conference Proceedings
Suzuki, Y.-I. ; Fukui, H. ; Tsuchiya, K. ; Ogata, Y.H.
Pub. info.: Fundamental aspects of electrochemical deposition and dissolution : proceedings of the international symposium.  pp.397-404,  1999.  Pennington, New Jersey.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-33
3.

Conference Proceedings

Conference Proceedings
Sasano, J. ; Jorne, J. ; Yoshimi, N. ; Tsuboi, T. ; Sakka, T. ; Ogata, Y.H.
Pub. info.: Fundamental aspects of electrochemical deposition and dissolution : proceedings of the international symposium.  pp.84-90,  1999.  Pennington, New Jersey.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-33
4.

Conference Proceedings

Conference Proceedings
Ogata, Y.H. ; Yoshimi, N. ; Tsuboi, T. ; Sakka, T.
Pub. info.: Pits and Pores : formation, properties, and significance for advanced materials : proceedings of the International Symposium.  pp.515-523,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-25
5.

Conference Proceedings

Conference Proceedings
Hirata, K. ; Masai, S. ; Sakka, T. ; Ogata, Y.H.
Pub. info.: Photon Processing in Microelectronics and Photonics IV.  pp.311-318,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5713
6.

Conference Proceedings

Conference Proceedings
Sakka, T. ; Hirata, K. ; Masai, S. ; Ogata, Y.H.
Pub. info.: Photon Processing in Microelectronics and Photonics IV.  pp.276-284,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5713