1.

Conference Proceedings

Conference Proceedings
Leszczynski,M. ; Prystawko,P. ; Czernecki,R. ; Lehnert,J. ; Perlin,P. ; Wisniewski,P. ; Skierbiszewski,Cz. ; Suski,T. ; Nowak,G. ; Karouta,F. ; Holst,J. ; Grzegory,I. ; Porowski,S.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  4413  pp.11-15,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
2.

Conference Proceedings

Conference Proceedings
Ostapenko,S.S. ; Savchuk,A.U. ; Nowak,G. ; Lagowski,J. ; Jastrzebski,L.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1897-1902,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201