1.

Conference Proceedings

Conference Proceedings
Marrakchi, G. ; Guillot, G. ; Nouailhat, A.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.509-514,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
2.

Conference Proceedings

Conference Proceedings
Bremond, G. ; Nouailhat, A. ; Guillot, G. ; Deveaud, B. ; Lambert, B. ; Toudic, Y. ; Clerjaud, B. ; Naud, C.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.359-364,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
3.

Conference Proceedings

Conference Proceedings
Bremond, G. ; Guillot, G. ; Nouailhat, A. ; Picoli, G.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.371-376,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46