1.

Conference Proceedings
Conference Proceedings
1. Optics development for the SPEAR mission
Ryu, K. ; Nishikida, K. ; Edelstein, J. ; Seon, K. ; Yuk, I. ; Min, K. ; Han, W. ; Korpela, E.J. ; Chung, R. ; McKee, K.
Pub. info.: Future EUV/UV and visible space astrophysics missions and instrumentation : 22-23 August 2002, Waikoloa, Hawaii, USA.  pp.457-466,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4854
2.

Conference Proceedings
Conference Proceedings
2. The SPEAR science payload
Korpela, E.J. ; Edelstein, J. ; Berg, P. ; Bowen, M.S. ; Chung, R. ; Feuerstein, M. ; Han, W. ; Hull, J.S. ; Jin, H. ; Lee, D. ; Min, K.W. ; Nam, U.-W. ; Nishikida, K. ; Rhee, J. ; Ryu, K. ; Seon, K.-I. ; Welsh, B.Y. ; Yuk, I.-S.
Pub. info.: Future EUV/UV and visible space astrophysics missions and instrumentation : 22-23 August 2002, Waikoloa, Hawaii, USA.  pp.665-675,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4854
3.

Conference Proceedings
Conference Proceedings
3. Joint AXAF high-resolution mirror assembly and AXAF CCD imaging spectrometer calibration at the MSFC X-ray calibration facility
Nousek, J. ; Townsley, L. ; Chartas, G. ; Burrows, D. ; Moskalenko, E. ; Sambruna, R. ; Pesce, J. ; Grant, C. ; Nishikida, K. ; Cawley, L. ; Broos, P. ; Koch, T.S. ; Garmire, A. ; Garmire, G. ; Bautz, M. ; Jones, S. ; LaMarr, B. ; Ricker, G.
Pub. info.: X-ray optics, instruments, and missions : 19-22 July 1998, San Diego, California.  pp.225-233,  1998.  Bellingham, Wash..  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3444
4.

Conference Proceedings
Conference Proceedings
4. X-ray CCD calibration for the AXAF CCD imaging spectrometer
Bautz, M. ; Pivovaroff, M. ; Baganoff, F. ; Isobe, T. ; Jones, S. ; Kissel, S. ; LaMarr, B. ; Manning, H. ; Prigozhin, G. ; Ricker, G. ; Nousek, J. ; Grant, C. ; Nishikida, K. ; Scholze, F. ; Thornagel, R. ; Ulm, G.
Pub. info.: X-ray optics, instruments, and missions : 19-22 July 1998, San Diego, California.  pp.210-224,  1998.  Bellingham, Wash..  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3444
5.

Conference Proceedings
Conference Proceedings
5. The Measurement of Submicron Epitaxial Layer Thickness and Free Carrier Concentration by Infrared Reflectance Spectroscopy
Fowler, B.W. ; Simmons, D.G. ; Carpio, R.A. ; Liu, S. ; Solomon, P.R. ; Nishikida, K.
Pub. info.: Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.254-265,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-33