1.

Conference Proceedings

Conference Proceedings
Li, Y. ; Ni, G. ; Zhang, J. ; Chen, X.
Pub. info.: Applications of digital image processing XXVI : 5-8 August 2003, San Diego, California, USA.  pp.607-614,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5203
2.

Conference Proceedings

Conference Proceedings
Sun, H. ; Xu, X. ; Ni, G.
Pub. info.: ICO20: remote sensing and infrared devices and systems : 21-26 August 2005, Changchun, China.  pp.603112-603112,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6031
3.

Conference Proceedings

Conference Proceedings
Lan, T. ; Ni, G.
Pub. info.: Advances in microelectronic device technology : 7-9 November 2001, Nanjing, China.  pp.179-183,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4600
4.

Conference Proceedings

Conference Proceedings
Zhang, J. ; Ni, G. ; Liu, M. ; Gui, X. ; Liu, X.
Pub. info.: Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China.  pp.532-539,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5637
5.

Conference Proceedings

Conference Proceedings
Zhang, J. ; Ni, G. ; Liu, M. ; Cui, X. ; Liu, X.
Pub. info.: Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China.  pp.146-155,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5637
6.

Conference Proceedings

Conference Proceedings
Lan, T. ; Ni, G.
Pub. info.: Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China.  pp.610-614,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5633