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13 results

Conference Proceedings

1. RIE-induced n-on-p junction HgCdTe photodiodes: effects of passivant technology on bake stability

Dell,J.M. ; Antoszewski,J. ; White,J.K. ; Pal,R. ; Nguyen,T. ; Musca,C.A. ; Faraone,L.

Pub. info.:	Materials for infrared detectors : 30 July-1 August 2001, San Diego, USA. pp.106-115, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4454

Conference Proceedings

2. Application Of A Reliability-Based Methodology For Predicting The Outdoor Service Life Of Polymers (433)

Chin,J.W. ; Martin,J.W. ; Nguyen,T. ; Embree,E. ; Byrd,W.E. ; Tate,J.D.

Pub. info.:	ANTEC 2002, annual technical conference, San Francisco, CA, May 5-9, 2002. 3 pp.3046-3049, 2002. Brookfield, Conn.. Society of Plastic Engineers.
Title of ser.:	Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.:	60

Conference Proceedings

3. Duplicate document detection in DocBrowse

Chalana,V. ; Bruce,A.G. ; Nguyen,T.

Pub. info.:	Document recognition V : 28-29 January 1998, San Jose, California. pp.169-178, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3305

Conference Proceedings

4. Dual damascene photo process using negative-tone resist

Shi,X. ; Fung,A.C. ; Hsu,S. ; Li,Z. ; Nguyen,T. ; Socha,R.J. ; Conley,W.E. ; Dusa,M.V.

Pub. info.:	Advances in resist technology and processing XVII : 28 February - 1 March 2000, Santa Clara, USA. Part2 pp.835-842, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3999

Conference Proceedings

5. Optimizing the performance of optical temperature sensors

Vegara,C. ; Wade,S.A. ; Nguyen,T. ; Farrell,P.M. ; Collins,S.F. ; Baxter,G.W.

Pub. info.:	Smart structures and devices : 13-15 December 2000, Melbourne, Australia. pp.278-287, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4235

Conference Proceedings

6. DocBrowse:a system for information retrieval from document image data

Jaisimha,M.Y. ; Bruce,A.G. ; Nguyen,T.

Pub. info.:	Storage and retrieval for still image and video databases IV : 1-2 February 1996, San Jose, California. pp.350-361, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2670

Technical Paper

7. ATM Trunking Using AAL-2 Over Satellites

Yegenoglu,F. ; Nguyen,T. ; Sciuto,A. ; Subbarayan,R.

Pub. info.:	A collection of the 18th AIAA International Communications Satellite Systems Conference and exhibit technical papers : Oakland, Ca, 10-14 April 2000. v. 2 pp.784-790, 2000. [Washington, D.C]. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : AIAA International Communications Satellite Systems Conference
Ser. no.:	2000

Technical Paper

8. An Evolvable Approach to Launch Vehicles for Exploration

Cheuvront,D. ; Nguyen,T.

Pub. info.:	AIAA meeting papers on disc. 2005. [Reston, Va.]. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : Space Exploration Conference
Ser. no.:	1st

Conference Proceedings

9. Dependence of EM performance on linewidth for Cu dual-inlaid structures

Zhao,L. ; Capasso,C. ; Marathe,A. ; Thrasher,S. ; Hernandez,R. ; Mulski,P. ; Rose,S. ; Nguyen,T. ; Gall,M. ; Kawasaki,H.

Pub. info.:	Microelectronic Yield, Reliability, and Advanced Packaging. pp.13-20, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4229

10.

Conference Proceedings

10. Electromigration failure modes and Blech effect in single-inlaid Cu interconnects

Thrasher,S. ; Capasso,C. ; Zhao,L. ; Hernandez,R. ; Mulski,P. ; Rose,S. ; Nguyen,T. ; Kawasaki,H.

Pub. info.:	Microelectronic Yield, Reliability, and Advanced Packaging. pp.1-7, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4229

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