Critical factors in localized corrosion IV : a symposium in honor of the 65th birthday of Hans Böhni : proceedings of the international symposium. pp.187-193, 2002. Pennington, N.J.. Electrochemical Society
Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.25-36, 1988. Pittsburgh, Pa.. Materials Research Society
Murray, R. ; Newman, R. C. ; Nandhra, P. S. ; Beall, R. B. ; Harris, J. J. ; Wright, P. J.
Pub. info.:
Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.543-548, 1988. Pittsburgh, Pa.. Materials Research Society
Lekatou, A. ; Qian, Y. ; Faidi, S. E. ; Lyon, S. B. ; Islam, N. ; Newman, R. C.
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Polymer/inorganic interfaces : symposium held April 14-16, 1993, San Francisco, California, U.S.A.. pp.27-, 1993. Pittsburgh, Pa.. MRS - Materials Research Society
Davidson, B. R. ; Newman, R. C. ; Pritchard, R. E. ; Bullough, T. J. ; Joyce, T. B. ; Jones, R. ; Oberg, S.
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Physics and applications of defects in advanced semiconductors : symposium held November 29-December 1, 1993, Boston, Massachusetts, U.S.A.. pp.241-, 1994. Pittsburgh, Pa.. MRS - Materials Research Society
McQuaid, S. A. ; Johnson, B. K. ; Gambaro, D. ; Falster, R. ; Ashwin, M. ; Newman, R. C.
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Diffusion mechanisms in crystalline materials : symposium held April 13-16, 1998, San Francisco, California, U.S.A.. pp.389-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Newman, R. C. ; Ashwin, M. J. ; Wagner, J. ; Fahy, M. R. ; Hart, L. ; Holmes, S. N. ; Roberts, C.
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Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A.. pp.567-, 1995. Pittsburgh, PA. MRS - Materials Research Society
Vuong, J. C. ; Newman, R. C. ; Alexander, M. R. ; Engelberg, D.
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Critical factors in localized corrosion IV : a symposium in honor of the 65th birthday of Hans Böhni : proceedings of the international symposium. pp.608-617, 2002. Pennington, N.J.. Electrochemical Society