1.

Conference Proceedings
Conference Proceedings
1. Measurement of Positron Work Function,Positronium Fraction and PAES Intensities from GaAs(100)
Kim,J.H. ; Nangia,A. ; Jung,E. ; Weiss,A.H.
Pub. info.: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.638-640,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 255-257
2.

Conference Proceedings
Conference Proceedings
2. Experimental Determination of Positron Related Surface Characteristics of 6H-SiC
Nangia,A. ; Kim,J.H. ; Weiss,A.H. ; Brauer,G.
Pub. info.: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.711-713,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 255-257
3.

Conference Proceedings
Conference Proceedings
3. Gate-Length-and threshold-voltage-dependent nonlinearity in the hot carrier DC Lifetime extrapolation for sub-100-nm NMOS devices
Chheda,S.N. ; Bhat,N. ; Tsui,P. ; Gonzales,S. ; Cave,N. ; Fu,C.-C. ; Huang,F. ; Nangia,A. ; Choi,P.S.-J. ; Collins,S.
Pub. info.: Microelectronic Device Technology III.  pp.175-185,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3881