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11 results

Conference Proceedings

1. Introduction of a die-to-database verification tool for the entire printed geometry of a die: geometry verification system NGR2100 for DFM

Kitamura, T. ; Kubota, K. ; Hasebe, T. ; Sakai, F. ; Nakazawa, S. ; Vohra, N. ; Yamamoto, M. ; Inoue, M.

Pub. info.:	Design and process integration for microelectronic manufacturing III : 3-4 March 2005, San Jose, California, USA. pp.73-84, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5756

Conference Proceedings

2. Surface Properties of Ca-Ion-Implanted Ti-Ni Shape-Memory Alloy

Asaoka, T. ; Nakazawa, S.

Pub. info.:	THERMEC '2003 : International Conference on Processing & Manufacturing of Advanced Materials, July 7-11, 2003, Leganés, Madrid, Spain. pp.3097-3102, 2003. Zuerich-Uetikon, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	426-432

Conference Proceedings

3. An Assessment of Ir-Nb-X (X=Hf,Ta,Ti) Ternary Alloys for Ultra-High Temperature Applications

Huang, C. ; Yamabe-Mitarai, Y. ; Nakazawa, S. ; Harada, H.

Pub. info.:	PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, Chin. pp.699-702, 2005. Uetikon-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	475-479(1)

Conference Proceedings

4. Recent Achievements and Future Challenges in SiC Homoepitaxial Growth

Kimoto, T. ; Nakazawa, S. ; Fujihira, K. ; Hirao, T. ; Nakamura, S. ; Chen, Y ; Hashimoto, K. ; Matsunami, H.

Pub. info.:	Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001. pp.165-170, 2002. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	389-393

Conference Proceedings

5. Recent Achievements and Future Challenges in SiC Homoepitaxial Growth

Kimoto, T. ; Nakazawa, S. ; Fujihira, K. ; Hirao, T. ; Nakamura, S. ; Chen, Y. ; Hashimoto, K. ; Matsunami, H.

Pub. info.:	Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001. pp.165-170, 2002. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	389-393

Technical Paper

6. Estimation for Degradation of Radiation Pattern due to Excitation Coefficient Error for Onboard Array-fed Reflector Antenna

Nakazawa, S. ; Tanaka, S. ; Murata, T.

Pub. info.:	A collection of the 21st AIAA International Communications Satellite Systems Conference and Exhibit technical papers, Yokohama, Japan, 15-19 April 2003. v. 1 pp.177-183, 2003. Reston, Va. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : AIAA International Communications Satellite Systems Conference
Ser. no.:	2003

Technical Paper

7. ON 3-D INELASTIC ANALYSIS METHODS FOR HOT SECTION COMPONENTS. VOLUME 1: SPECIAL FINITE ELEMENT MODELS Annual

Nakazawa, S.

Pub. info.:

NASA Technical Reports. (NASA-CR-179494), pp.1-102, 1987. National Aeronautics and Space Administration

Technical Paper

8. A Study on Rolling Contact Fatigue of Silicon Nitride Ceramics Roller of Supply Pump for Diesel Injection System.

Asai, H. ; Nakazawa, S. ; Miyakawa, S. ; Kitamura, K.

Pub. info.:	2004 SAE world congress : technical paper. 2004. Warrendale, Penn.. Society of Automotive Engineers
Title of ser.:	Society of Automotive Engineers technical paper series
Ser. no.:	2004

Technical Paper

9. ON 3-D INELASTIC ANALYSIS METHODS FOR HOT SECTION COMPONENTS. VOLUME 1: SPECIAL FINITEELEMENT MODELS Annual Report No.4,14 Feb. 1986 - 14 Feb. 1987

Nakazawa, S.

Pub. info.:

NASA Technical Reports(N88-). (NASA-CR-180893), pp.1-81, 1988. National Aeronautics and Space Administration

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Conference Proceedings

10. Introduction of a die-to-database verification tool for mask geometry NGR4000 [6349-150]

Hoffman, M. J. ; Kitamura, T. ; Kubota, K. ; Hasebe, T. ; Nakazawa, S. ; Tokumoto, T. ; Tsuneoka, M. ; Yamamoto, M. ; lnoue, M.

Pub. info.:	Photomask Technology 2006. pp.634940-634940, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6349

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Author: Nakazawa, S.