1.

Conference Proceedings
Conference Proceedings
1. Performance analysis of waveguide-type InGaAsP/InP fully depleted optical thyristors for optical communication system
Lee,J.-J. ; Kim,D.G. ; Choi,J.K. ; Choi,Y.-W. ; Han,S.Y. ; Lee,S.B. ; Kim,S.H. ; Nakano,Y. ; Futakuchi,N.
Pub. info.: Physics and simulation of optoelectronic devices VIII : 24-28 January 2000, San Jose, USA.  Part2  pp.926-934,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3944
2.

Conference Proceedings
Conference Proceedings
2. Self-align electrode separation of directionally coupled semiconductor optical amplifier
Takenaka,M. ; Saitoh,M. ; Nakano,Y.
Pub. info.: Active and passive optical components for WDM communication, 21-24 August 2001, Denver, USA.  pp.361-368,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4532
3.

Conference Proceedings
Conference Proceedings
3. Electroabsorption modulator integrated distributed feedback lasers for trunk line fiber communication
Sun,C.-Z. ; Wen,G.-P. ; Xiong,B. ; Luo,Y. ; Li,T.-N. ; Nakano,Y.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.864-869,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
4.

Conference Proceedings
Conference Proceedings
4. Impurity Diffusion into GaAs through the SiO2 Protective Layers
Gautam,D.K. ; Shimogaki,Y. ; Nakano,Y. ; Tada,K.
Pub. info.: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.417-422,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 117-118
5.

Technical Paper
Technical Paper
5. A New Method of Reliability Testing for C-MOS VLSI's Evaluation
Himi,H. ; Hara,K. ; Mori,H. ; Endo,K. ; Nakano,Y.
Pub. info.: Proceedings of the Fourth International Pacific Conference on Automotive Engineering : Melbourne, Australia, November 8-14, 1987 : mobility, the technical challenge.  pp.292-,  1987.  Warrendale, Pa..  Society of Automotive Engineers
Title of ser.: SAE publication
Ser. no.: P-212
6.

Conference Proceedings
Conference Proceedings
6. Imaging of rotational Brownian motion of biomolecules in living cells using fluorescence depolarization microscopy
Toyonaga,S. ; Nakano,Y.
Pub. info.: Optical Investigations of Cells In Vitro and In Vivo.  pp.84-95,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3260