Nakae, T. ; Guan, L. ; Yoneyama, H. ; Germ, M. ; Nakajima, A.
Pub. info.:
Clinical diagnostic systems : technologies and instrumentation : 22-24 January 2002, San Jose, USA. pp.106-117, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering