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Physicas and technology of high-k gate dielectrics : proceedings of the International Symposium on High Dielectric Constant Materials : Materials Science, Processing, and Reliability, and Manufacturing Issues. pp.83-92, 2002. Pennington, NJ. Electrochemical Society
R. C. Frohn ; L. Liu ; R. A. Beck ; N. Chaudhary ; O. Arellano-Neri
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Geoinformatics 2008 and Joint Conference on GIS and Built Environment : classification of remote sensing images : 28-29 June 2008, Guangzhou, China. pp.71470D-1-71470D-9, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering