Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing : 30-31 July 2001, San Diego, USA. pp.112-123, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared Detectors and Focal Plane Arrays V : 14-17 April 1998, Orlando, Florida. pp.145-156, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Infrared technology and applications XXV : 5-9 April 1999, Orlando, Florida. pp.308-319, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA. pp.12-16, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Infrared Detectors and Focal Plane Arrays IV : 10-11 April 1996, Orlando, Florida. pp.23-31, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Surveillance and Assessment Technologies for Law Enforcement. pp.182-187, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering