1.

Conference Proceedings
Conference Proceedings
1. 9 μm Cutoff 256x256 GaAs/Al x Gal-x As Quantum Well Infrared Photodetector Focal Plane Array Camera
Gunapala, S.D. ; Liu, J.K. ; Sundaram, M. ; Park, J.S. ; Shott, C.A. ; Hoelter, T. ; Lin, T.L. ; Massie, S.T. ; Maker, P.D. ; Muller, R.E. ; Sarusi, G.
Pub. info.: Proceedings of the Third International Symposium on long wavelength infrared detectors and arrays : physics and applications III.  pp.55-66,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-28
2.

Conference Proceedings
Conference Proceedings
2. Electron-beam lithography for micro- and nano-optical applications (Invited Paper)
Wilson, D.W. ; Muller, R.E. ; Echternach, P.M. ; Backlund, J.P.
Pub. info.: Micromachining technology for micro-optics and nano-optics III : 25-27 January 2005, San JOse, California, USA.  pp.68-77,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5720
3.

Conference Proceedings
Conference Proceedings
3. Grating fabrication through x-ray lithography
Mouroulis, P.Z. ; Hartley, F.T. ; Muller, R.E. ; Wilson, D.W. ; Shori, A. ; Feldman, M. ; Jiang, L. ; Christenson, T.R.
Pub. info.: Current developments in lens design and optical engineering IV : 3-4 August 2003, San Diego, California, USA.  pp.108-114,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5173
4.

Conference Proceedings
Conference Proceedings
4. Recent advances in blazed grating fabrication by electron-beam lithography
Wilson, D.W. ; Maker, P.D. ; Muller, R.E. ; Mouroulis, P.Z. ; Backlund, J.
Pub. info.: Current developments in lens design and optical engineering IV : 3-4 August 2003, San Diego, California, USA.  pp.115-126,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5173