Image and signal processing for remote sensing XI : 20-22 September, 2005, Bruges, Belgium. pp.598208-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Contreras, S. ; Zielinski, M. ; Konczewicz, L. ; Blanc, C. ; Juillaguet, S. ; Muller, R. ; Kunecke, U. ; Wellmann, P.J. ; Camassel, I.
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Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.633-636, 2006. Stafa-Zuerich. Trans Tech Publications
Schneider, P. ; Voide, R. ; Stauber, M. ; Stampanoni, M. ; Donahue, L. R. ; Wyss, P. ; Sennhauser, U. ; Muller, R.
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Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA. pp.63180C-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Pudewills, A. ; Muller, R. ; Korthaus, E. ; Koster, R.
Pub. info.:
Scientific basis for nuclear waste management V : proceedings of the Materials Research Society Fifth International Symposium on the Scientific Basis for Nuclear Waste Management, held June 7-10, 1982, in Berlin, Germany. pp.477-486, 1982. New York. North-Holland
Wellmann, P.J. ; Queren, D. ; Muller, R. ; Sakwe, S.A. ; Knnecke, U.
Pub. info.:
Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.79-82, 2006. Stafa-Zuerich. Trans Tech Publications
Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.75-78, 2006. Stafa-Zuerich. Trans Tech Publications
Heinzer, S. ; Krucker, T. ; Stampanoni, M. ; Abela, R. ; Meyer, E.P. ; Schuler, A. ; Schneider, P. ; Muller, R.
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Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA. pp.65-76, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Scientific basis for nuclear waste management XV : symposium held November 4-7, 1991, Strasbourg, France. pp.143-150, 1992. Pittsburgh, Pa.. Materials Research Society
43rd Annual Technical Conference : ANTEC 85 : plastics : April 29-May 2, 1985 Sheraton Washington Hotel, Washington, D.C.. pp.616-618, 1985. Brookfield Center, CT. Society of Plastics Engineers, Inc. (SPE)
Title of ser.:
Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers