1.

Conference Proceedings
Conference Proceedings
1. The scanning infra-red microscope: An alternative tool to measure bulk micro-defect density in semiconductors
Mule'Stagno, L. ; Bazzali, A. ; Olmo, M. ; Toeroek, P. ; Faister, R. ; Fraundorf, P.
Pub. info.: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.431-437,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-22
2.

Conference Proceedings
Conference Proceedings
2. Crystal Defect Information Obtained by Multiple Wafer Recleaning
Mule'Stagno, L. ; Keltner, S. ; Yalamanchili, R. ; Kulkami, M. ; Libbert, J. ; Banan, M.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.646-659,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
3.

Conference Proceedings
Conference Proceedings
3. INVITED: INTRINSIC POINT DEFECTS AND REACTIONS IN THE GROWTH OF LARGE SILICON CRYSTALS
Falster, R. ; Voronkov, V.V. ; Holzer, J.C. ; Markgrafh, S. ; McQuaid, S.A. ; Mule'Stagno, L.
Pub. info.: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.468-489,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-1(1)
4.

Conference Proceedings
Conference Proceedings
4. A TECHNIQUE FOR DELINEATING DEFECTS IN SILICON
Mule'Stagno, L.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.297-306,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2