Mueller, J. ; Durst, K. ; Amberger, D. ; Goken, M.
Pub. info.:
Nanomaterials by severe plastic deformation : NanoSPD3 : proceedings of the 3rd Conference on Nanomaterials by Severe Plastic Deformation held at Fukuoka, Japan on September 22-26, 2005. pp.31-36, 2006. Uetikon-Zuerich. Trans Tech Publications
Cremer, R. ; Mueller, J. ; Neuschultz, D. ; Leyendecker, T. ; Lemmer, O. ; Frank, M. ; Gussone, J.
Pub. info.:
Fundamental gas-phase and surface chemistry of vapor-phase deposition II and process control, diagnostics, and modeling in semiconductor manufacturing IV : proceedings of the international symposium. pp.365-372, 2001. Pennington, N.J.. Electrochemical Society
Fundamental gas-phase and surface chemistry of vapor-phase deposition II and process control, diagnostics, and modeling in semiconductor manufacturing IV : proceedings of the international symposium. pp.129-135, 2001. Pennington, N.J.. Electrochemical Society
Fundamental gas-phase and surface chemistry of vapor-phase deposition II and process control, diagnostics, and modeling in semiconductor manufacturing IV : proceedings of the international symposium. pp.124-128, 2001. Pennington, N.J.. Electrochemical Society
Schmidt, B. ; Lichtenstein, N. ; Sverdlov, B. ; Matuschek, N. ; Mohrdiek, S. ; Pliska, T. ; Mueller, J. ; Pawlik, S. ; Arlt, S. ; Pfeiffer, H.-U. ; Fily, A. ; Harder, C.
Pub. info.:
Semiconductor optoelectronic devices for lightwave communication :8-10 September 2003, Orlando, Florida, USA. pp.42-54, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Larsson, R. ; Mueller, J. ; Thomas, S. ; Jakobsson, B. ; Bodin, P.
Pub. info.:
The 3rd International Symposium on Formation Flying Missions and Technologies : 23-25 April 2008, ESA-ESTEC, Noordwijk, The Netherlands. 2008. Noordwijk, The Netherlands. ESA Communications
Koski, K. ; Mueller, J. ; Hochheimer, H.D. ; Yarger, J.L.
Pub. info.:
Frontiers of high pressure research II: application of high pressure to low-dimensional novel electronic materials. pp.533-540, 2001. Dordrecht. Kluwer Academic Publishers
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Aminou, D.M.A. ; Ottenbacher, A. ; Hanson, C.G. ; Pili, P. ; Mueller, J. ; Blancke, B. ; Jacquet, B. ; Bianchi, S. ; Coste, P. ; Pasternak, F. ; Faure, F.
Pub. info.:
Earth observing systems VIII : 3-6 August 2003, San Diego, California, USA. pp.599-608, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Twardowski, M. S. ; Zaneveld, J. R. V. ; Moore, C. M. ; Mueller, J. ; Trees, C. ; Schofield, O. ; Freeman, S. ; Helble, T. ; Hong, G.
Pub. info.:
Photonics for port and harbor security : 29-30 March 2005, Orlando, Florida, USA. pp.71-80, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering