1.

Conference Proceedings
Conference Proceedings
1. In Situ Real-Time Ellipsometry Study of Dynamic Processes of YBa2Cu3O7-x Thin Films
Gao, Y. ; Mueller, A. H. ; Irene, E. A. ; Auciello, O. ; Krauss, A. R. ; Schultz, J. A.
Pub. info.: In situ process diagnostics and modelling : symposium held April 6-7, 1999, San Francisco, California, U.S.A..  pp.77-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 569
2.

Conference Proceedings
Conference Proceedings
2. Combined Spectroscopic Ellipsometry and Ion Beam Surface Analysis for In Situ, Real-Time Characterization of Complex Oxide Film Growth
Mueller, A. H. ; Gao, Y. ; Irene, E. A. ; Auciello, O. ; Krauss, A. R. ; Schultz, J. A.
Pub. info.: In situ process diagnostics and modelling : symposium held April 6-7, 1999, San Francisco, California, U.S.A..  pp.15-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 569
3.

Conference Proceedings
Conference Proceedings
3. Study of Interface Formation of (Ba,Sr)TiO3 Thin Films Grown by rf Sputter Deposition on Bare Si and Thermal SiO2/Si Substrates
Suvorova, N. A. ; Mueller, A. H. ; Suvorova, A. A. ; Saunders, M. ; Irene, E. A.
Pub. info.: Crystalline oxide-silicon heterostructures and oxide optoelectronics : symposium held December 2-4, 2002, Boston, Massachusetts, U.S.A..  pp.183-192,  2003.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 747