1.

Conference Proceedings
Conference Proceedings
1. Localisation of Photoactivated Processes in Poly-Bithiophene
Morgenstern,T. ; Konig,U. ; Schultze,J.W.
Pub. info.: New Material : conjugated double bond systems : proceedings of the 5th International Autumn School, held in Warsaw, Poland, September 26-30, 1994.  pp.213-218,  1995.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 191
2.

Conference Proceedings
Conference Proceedings
2. Investigations on the ternary systems Fe-Mo-O and Ni-Mo-O
Morgenstern,T. ; Lienhardt,J.L. ; Reichelt,W. ; Konig,U. ; Oppermann,H.
Pub. info.: EPDIC 2 : proceedings of the Second European Powder Diffraction Conference, held, July 30 - August 1, 1992, in Enschede, The Netherlands.  Pt.2  pp.627-632,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 133-136
3.

Conference Proceedings
Conference Proceedings
3. Point Defects in SiGe Epitaxial Layers and Bulk Crystals
Erzgraber,H.B. ; Kissinger,G. ; Krtiger,D. ; Morgenstern,T. ; Schmalz,K. ; Schilz,J. ; Kurten,M. ; Osinsky,A.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.489-494,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
4.

Conference Proceedings
Conference Proceedings
4. Maturity assessment of 300-mm etch equipment
Mautz,K.E. ; Morgenstern,T.
Pub. info.: Process Control and Diagnostics.  pp.308-315,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4182
5.

Conference Proceedings
Conference Proceedings
5. Evaluation techniques for 300-mm equipment
Mautz,K.E. ; Morgenstern,T. ; Schuster,R.
Pub. info.: Process Control and Diagnostics.  pp.316-326,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4182