1.

Conference Proceedings
Conference Proceedings
1. Accurate Infrared Absorption Measurement of Interstitial and Precipitated Oxygen in Heavily Doped Silicon
De Gryse, O. ; Clauws, P. ; Rossou, L. ; Van Landuyt, J. ; Vanhellemont, J. ; Mondelaers, W.
Pub. info.: Proceedings of the Fifth International Symposium on High Purity Silicon V.  pp.398-409,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-13
2.

Conference Proceedings
Conference Proceedings
2. Vacancy Creation in Electron Irradiated Ni3Al
van Petegem, S. ; Zhurkin, E.E. ; Mondelaers, W. ; Segers, D.
Pub. info.: Positron annihilation ICPA-13 : proceedings of the 13th International Conference on Positron Annihilation, Kyoto, Japan, September 2003.  pp.207-209,  2004.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 445-446
3.

Conference Proceedings
Conference Proceedings
3. Positron Annihilation in Ni3Al: Theory and Experiment
Petegem, S.. ; Kuriplach, J. ; Hou, M. ; Zhurkin, E.E. ; Segers, D. ; Morales, A.L. ; Ettaoussi, S. ; Dauwe, C. ; Mondelaers, W.
Pub. info.: Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany.  pp.210-212,  2001.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 363-365