1.

Conference Proceedings
Conference Proceedings
1. Nanometrology device standards for scanning probe microscopes and processes for their fabrication and usage [6000-29]
Moeck, P.
Pub. info.: Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA.  pp.60000Q-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6000
2.

Conference Proceedings
Conference Proceedings
2. Identifying unknown nanocrystals by fringe fingerprinting in two dimensions and free-access crystallographic databases [6000-25]
Moeck, P. ; -ertIk, O. ; Seipel, B. ; Groebner, R. ; Noice, L. ; Upreti, G. ; Fraundorf, P. ; Erni, R. ; Browning, N.D. ; Kiesow, A. ; Jolivet, J.
Pub. info.: Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA.  pp.60000M-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6000
3.

Conference Proceedings
Conference Proceedings
3. Image-Based Nanocrystallography in Future Aberration-Corrected Transmission Electron Microscopes
Moeck, P. ; Qin, W. ; Fraundorf, P.B.
Pub. info.: Nanoparticles and nanowire buildings blocks--synthesis, processing, characterization and theory : symposium held April 13-16, 2004, San Francisco, California, U.S.A..  pp.247-252,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 818
4.

Conference Proceedings
Conference Proceedings
4. Structural transformations in self-assembled semiconductor quantum dots as inferred by transmission electron microscopy
Moeck, P. ; Lei, Y.Y. ; Topuria, T. ; Browning, N.D. ; Ragan, R. ; Kim, K.S. ; Atwater, H.A.
Pub. info.: Physical Chemistry of Interfaces and Nanomaterials.  pp.71-82,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4807