1.

Conference Proceedings
Conference Proceedings
1. Role of growth defects on carrier dynamics: semi-insulating GaAs
Mizeikis,V. ; Jarasiunas,K. ; Storasta,J. ; Gudelis.V. ; Bastiene,L. ; Sudzius,M.
Pub. info.: International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine.  pp.163-170,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3359
2.

Conference Proceedings
Conference Proceedings
2. Subpicosecond optical damaging of silica: time-resolved measurements of the light-induced damage threshold
Juodkazis,S. ; Marcindevicius,A. ; Watanabe,M. ; Mizeikis,V. ; Matsuo,S. ; Misawa,H.
Pub. info.: Laser-induced damage in optical materials, 2000 : 32nd Annual Boulder Damage Symposium, proceedings, 16-18, October, 2000, Boulder, Colorado.  pp.212-222,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4347
3.

Conference Proceedings
Conference Proceedings
3. Application of femtosecond Bessel-Gauss beam in microstructuring of transparent materials
Marcinkevicius,A. ; Juodkazis,S. ; Mizeikis,V. ; Matsuo,S. ; Misawa,H.
Pub. info.: Optical pulse and beam propagation III : 24-25 January 2001, San Jose, USA.  pp.150-158,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4271
4.

Conference Proceedings
Conference Proceedings
4. Influence of Growth Defects on Carrier Lifetime and Transport in Semiinsulating GaAs Studied by Transient Light-Induced Grating Technique
Mizeikis,V. ; Jarasiunas,K. ; Gudelis,V. ; Sodzius,M.
Pub. info.: Ultrafast phenomena in semiconductors : proceedings of the 10th International Symposium on Ultrafast Phenomena in Semiconductors (10-UFPS), held in Vilnius, Lithuania, August/September, 1998.  pp.115-118,  1999.  Zurich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 297-298
5.

Conference Proceedings
Conference Proceedings
5. Nondestructive Characterisation of MOVPE-Grown CdTe and ZnTe Epilayers by Picosecond and Nanosecond"Excite-Probe"Techniques
Gaubas,E. ; Mizeikis,V. ; Bastiene,L. ; Jarasiunas,K. ; Lovergine,N. ; Mancini,A.M. ; Prete,P. ; Subacius,L.
Pub. info.: Ultrafast phenomena in semiconductors : proceedings of the 10th International Symposium on Ultrafast Phenomena in Semiconductors (10-UFPS), held in Vilnius, Lithuania, August/September, 1998.  pp.111-114,  1999.  Zurich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 297-298
6.

Conference Proceedings
Conference Proceedings
6. Fabrication of 3D interconnected network of microchannels inside silica by femtosecond irradiation and etching
Marcinkevicius,A. ; Juodkazis,S. ; Mizeikis,V. ; Watanabe,M. ; Matsuo,S. ; Nishii,J. ; Misawa,H.
Pub. info.: Laser Applications in Microelectronic and Optoelectronic Manufacturing VI.  pp.469-477,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4274
7.

Conference Proceedings
Conference Proceedings
7. Stereolithography and 3D microstructuring of transparent materials by femtosecond laser irradiation(Invited Paper)
Juodkazis, S. ; Horyama, M. ; Miwa, M. ; Watanabe, M. ; Marcinkevicius, A. ; Mizeikis,V. ; Matsuo, S. ; Misawa, H.
Pub. info.: Seventh International Conference on Laser and Laser-Information Technologies.  pp.27-38,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4644
8.

Conference Proceedings
Conference Proceedings
8. Nondestructive characterization of porous silicon structures by transient grating technique
Jarasiunas,K. ; Sudzius,M. ; Subacius,L. ; Simkiene,I. ; Mizeikis,V.
Pub. info.: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics.  pp.226-231,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2648
9.

Conference Proceedings
Conference Proceedings
9. Time-resolved study of femtosecond microfabrication in silica glass
Misawa,H. ; Juodkazis,S. ; Marcinkevicius,A. ; Watanabe,M. ; Mizeikis,V. ; Matsuo,S.
Pub. info.: Laser Applications in Microelectronic and Optoelectronic Manufacturing VI.  pp.98-109,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4274