1.

Conference Proceedings
Conference Proceedings
1. A method searching an optimal lighting : application to defect detection by artificial vision in industrial field
Geveaux, P. ; Kohler, S. ; Miteran, J. ; Truchetet, F.
Pub. info.: Intelligent robots and computer vision XVII : Algorithms, techniques, and active vision : 2-3 November 1998 Boston, Massachusetts.  pp.124-129,  1998.  Bellingham, Wash., USA.  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3522
2.

Conference Proceedings
Conference Proceedings
2. Real-time image segmentation for anomaly detection using SVM
Bouillant, S. ; Miteran, J. ; Paindavoine, M. ; Bourennane, E. ; Bourgeat, P.T.
Pub. info.: Sixth International Conference on Quality Control by Artificial Vision.  pp.539-545,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5132
3.

Conference Proceedings
Conference Proceedings
3. Real-time flaw detection on complex part: classification with SVM and Hyperrectangle-based method
Bouillant, S. ; Miteran, J. ; Paindavoine, M. ; Meriaudeau, F.
Pub. info.: Machine Vision Applications in Industrial Inspection XII.  pp.170-177,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5303
4.

Technical Paper
Technical Paper
4. Real-Time Image Segmentation for Anomailies Detection Using SVM Approximation.
Bouillant, S. ; Miteran, J. ; Paindavoine, M. ; Bourennane, E. ; Bourgeat, P.
Pub. info.: SME technical paper.  2003.  Society of Manufacturing Engineers