1.

Conference Proceedings
Conference Proceedings
1. Mesoscopic transport in broken down ultrathin SiO2 films
Miranda, E. ; Sune, N. ; Rodriguez, R. ; Nafria, M. ; Aymerich, X.
Pub. info.: Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A..  pp.93-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 592
2.

Conference Proceedings
Conference Proceedings
2. Evaluation of the degradation dynamics of thin silicon dioxide films using model-independent procedures
Rodriguez, R. ; Nafria, M. ; Miranda, E. ; Sune, J. ; Aymerich, X.
Pub. info.: Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A..  pp.147-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 592
3.

Conference Proceedings
Conference Proceedings
3. Soft and Hard Breakdown of Ultrathin SiO2 Gate Oxides
Sune, J. ; Miranda, E.
Pub. info.: The physics and chemistry of SiO2 and the Si-SiO2 interface-4, 2000 : proceedings of the fourth International Symposium on the Physics and Chemistry of SiO2 and the Si-SiO2 Interface, Tronto, Canada, May 15-18, 2000.  pp.333-344,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-2