1.

Conference Proceedings
Conference Proceedings
1. Predicting the Effects of Corrosion on the Performance of Electrical Contacts
Sorensen, R. ; Chen, K.S. ; Guilinger, T.R. ; Braithwaite, J.W. ; Michael, J.R.
Pub. info.: Corrosion and corrosion protection : proceedings of the international symposium.  pp.706-713,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-22
2.

Conference Proceedings
Conference Proceedings
2. SEGREGATION GEY?ERING BY IMPLANTATION-FORMED CAVITIES AND B-Si PRECIPITATES IN SILICON
Myers, S. ; Petersen, G.A. ; Follstaedt, D.M. ; Seager, C.H. ; Headly, T.J. ; Michael, J.R. ; Deweerd, W. ; Koops, G. ; Verheyden, J. ; Pattyn, H.
Pub. info.: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.1150-1162,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-1(2)
3.

Conference Proceedings
Conference Proceedings
3. AEM MICROANALYSIS OF PHASE EQULIBRIA IN Ni3Al INTERMETALLIC ALLOYS CONTAINING IRON
Bramfitt, B.L. ; Michael, J.R.
Pub. info.: Materials problem solving with the transmission electron microscope : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A..  pp.201-208,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 62
4.

Conference Proceedings
Conference Proceedings
4. QUANTITATIVE MICROANALYSIS OF FINE PRECIPITATES IN MICROALLOYED STEELS
Michael, J.R.
Pub. info.: Materials problem solving with the transmission electron microscope : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A..  pp.263-272,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 62
5.

Conference Proceedings
Conference Proceedings
5. CHARACTERIZATION OF THE EFFECT OF Au/Al BONDPAD CORROSION ON MICROELECTRONIC DEVICE RELIABILITY
Sorensen, N.R. ; Braithwaite, J.W. ; Peterson, D.W. ; Michael, J.R. ; Robinson, D.G. ; Strizich, M.P.
Pub. info.: Corrosion and reliability of electronic materials and devices : proceedings of the fourth international symposium.  pp.205-216,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-29