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Conference Proceedings

1. Excess Carrier Lifetime and Surface Recombination Velocity in Dielectrically Isolated SI-Tubs

Meynants, G. ; Poortmans, J. ; Mertens, R. ; Jones, S. ; Polce, N. ; Blackstone, S.

Pub. info.:	Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding : science, technology, and applications. pp.257-263, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-36

Conference Proceedings

2. The project SVAVISCA : a space-variant color CMOS sensor

Sandini, G. ; Alaerts, A. ; Dierickx, B. ; Ferrari, F. ; Hermans, L. ; Mannucci, A. ; Parmentier, B. ; Questa, P. ; Meynants, G. ; Scheffer, D.

Pub. info.:	Advanced focal plane arrays and electronic cameras II : 18-19 May, 1998, Zurich, Switzerland. pp.34-45, 1998. Bellingham, Washington. SPIE
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3410

Conference Proceedings

3. 1024×1280-pixel dual shutter APS for industrial vision

Witters, H. ; Walschap, T. ; Vanstraelen, G. ; Chapinal, G. ; Meynants, G. ; Dierickx, B.

Pub. info.:	Sensors and camera systems for scientific, industrial, and digital photography applications IV : 21-23 January, 2003, Santa Clara, California, USA. pp.19-23, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5017

Conference Proceedings

4. A 14-megapixel 36 x 24-mm2 image sensor

Meynants, G. ; Scheffer, D. ; Dierickx, B. ; Alaerts, A.

Pub. info.:	Sensors and camera systems for scientific, industrial, and digital photography applications V : 19-21 January, 2004, San Jose, California, USA. pp.168-174, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5301