1.
Conference Proceedings
Delcroix, G. ; Aluze, D. ; Merienne, F. ; Jender, H. ; Dumont, C.
Pub. info.:
Machine vision systems for inspection and metrology VII : 4-5 November, 1998, Boston, Massachusetts . pp.104-114, 1998. Bellingham. SPIE
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3521
2.
Conference Proceedings
Paillot, D. ; Merienne, F. ; Neveu, M. ; Frachet, J.P. ; Thivent, S.
Pub. info.:
Stereoscopic Displays and Virtual Reality Systems X . pp.445-452, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5006
3.
Conference Proceedings
Bonnot, N. ; Seulin, R. ; Merienne, F.
Pub. info.:
Machine Vision Applications in Industrial Inspection XII . pp.64-72, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5303
4.
Conference Proceedings
Seulin, R. ; Bonnot, N. ; Merienne, F. ; Gorria, P.
Pub. info.:
Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II . pp.129-140, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4567