1.

Conference Proceedings

Conference Proceedings
Suenaga, T. ; Meessen, J. ; Verschueren, Y. ; Macq, B.M.M.
Pub. info.: Applications of digital image processing XXVI : 5-8 August 2003, San Diego, California, USA.  pp.314-322,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5203
2.

Conference Proceedings

Conference Proceedings
Djavdan, P. ; Meessen, J.
Pub. info.: Safety in ammonia plants & related facilities simposium : AIChe technical manual.  pp.199-205,  2004.  New York.  American Institute of Chemical Engineers
Title of ser.: AIChE Conference Proceedings
Ser. no.: 44
3.

Conference Proceedings

Conference Proceedings
Dooyeweerd, E. ; Meessen, J.
Pub. info.: AIChE Summer Meeting, Denver - 8/28-8/31, 1983.  1983.  New York.  American Institute of Chemical Engineers
Title of ser.: AIChE meeting [papers]
Ser. no.: 1983
4.

Conference Proceedings

Conference Proceedings
Meessen, J. ; Parisot, C. ; Barz, C. Le ; Nicholson, D. ; Delaigle, J. F.
Pub. info.: Image and Video Communications and Processing 2005.  pp.14-26,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5685
5.

Conference Proceedings

Conference Proceedings
Nicholson, D. ; Meessen, J.
Pub. info.: Image and Video Communications and Processing 2005.  pp.1-13,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5685
6.

Conference Proceedings

Conference Proceedings
Meessen, J. ; Delaigle, J. -F. ; Xu, L. -Q. ; Macq, B.
Pub. info.: Image and Video Communications and Processing 2005.  pp.129-138,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5685
7.

Conference Proceedings

Conference Proceedings
Onozuka, T. ; Ojima, Y. ; Meessen, J. ; Rijpers, B.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XX.  pp.61521D-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6152
8.

Conference Proceedings

Conference Proceedings
Cramer, H. ; Kiers, T. ; Vanoppen, P. ; Meessen, J. ; Blok, F. ; Dusa, M.V.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.1254-1264,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375
9.

Conference Proceedings

Conference Proceedings
Desurmont, X. ; Lienard, B. ; Meessen, J. ; Delaigle, J. -F.
Pub. info.: Real-Time Imaging IX.  pp.85-92,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5671