1.

Conference Proceedings

Conference Proceedings
O'Dell, S.L. ; Baker, M.A. ; Carter, J.M. ; Content, D.A. ; Davis, W.N. ; Freeman, M.D. ; Glenn, P.E. ; Gubarev, M.V. ; Hair, J.H. ; Kolodziejczak, J.J. ; Jones, W.D. ; Joy, M.K. ; McCracken, J.E. ; Nanan, G. ; Owens, S.M. ; Petre, R. ; Podgorski, W.A. ; Ramsey, B.D. ; Saha, T.T. ; Stewart, J.W. ; Swartz, D.A. ; Zhang, W.W. ; Zirnstein, G.X.
Pub. info.: Optics for EUV, X-Ray, and gamma-ray astronomy : 4-7 August 2003, San Diego, California, USA.  pp.306-317,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5168
2.

Conference Proceedings

Conference Proceedings
Jacoby, M.T. ; Goodman, W.A. ; Stahl, H.P. ; Keys, A.S. ; Reily, J.C. ; Eng, R. ; Hadaway, J.B. ; Hogue, W.D. ; Kegley, J.R. ; Siler, R.D. ; Haight, H.J. ; Tucker, J. ; Wright, E.R. ; Carpenter, J.R. ; McCracken, J.E.
Pub. info.: Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA.  pp.199-210,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5180