1.

Conference Proceedings
Conference Proceedings
1. TEM SAMPLES OF SEMICONDUCTORS PREPARED BY A SMALL-ANGLE CLEAVAGE TECHNIQUE
McCaffrey, J. P.
Pub. info.: Specimen preparation for transmission electron microscopy of materials III : symposium held December 5-6, 1991, Boston, Mass., U.S.A..  pp.109-120,  1992.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 254
2.

Conference Proceedings
Conference Proceedings
2. Preparation of Cross-Sectional TEM Samples of PbTe and CdxPb1-xTe on BaF2
McCaffrey, J. P. ; Das, S. R. ; Cook, J. G.
Pub. info.: Specimen preparation for transmission electron microscopy of materials--II : symposium held April 19-20, 1990, San Francisco, California, U.S.A..  pp.131-136,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 199
3.

Conference Proceedings
Conference Proceedings
3. Quantum confinement in nanocrystalline superlattices
Grom, G. F. ; Fauchet, P. M. ; Tsybeskov, L. ; McCaffrey, J. P. ; Labbe, H. J. ; Lockwood, D. J.
Pub. info.: Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A..  pp.363-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 592
4.

Conference Proceedings
Conference Proceedings
4. *Optical and microstructural characterization of nanocrystalline silicon superlattices
Tsybeskov, L. ; Grom, G. F. ; Krishnan, R. ; Fauchet, P. M. ; McCaffrey, J. P. ; Baribeau, J-M. ; Sproule, G. I. ; Lockwood, D. J. ; Timoshenko, V. ; Diener, J. ; Heckler, H. ; Kovalev, D. ; Koch, F. ; Blanton, T. N.
Pub. info.: Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A..  pp.173-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 588
5.

Conference Proceedings
Conference Proceedings
5. Structural Characterization of nc-Si/a-SiO2 Superlattices Subjected to Thermal Treatment
Grom, G. F. ; Tsybeskov, L. ; Hirschman, K. D. ; Fauchet, P. M. ; McCaffrey, J. P. ; Labbe, H. J. ; Lockwood, D. J.
Pub. info.: Microcrystalline and nanocrystalline semiconductors--1998 : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A..  pp.141-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 536
6.

Conference Proceedings
Conference Proceedings
6. Process Windows of Nickel and Platinum Silicides in Deep Sub-Micron Regime
Xu, D-X. ; Das, S. R. ; McCaffrey, J. P. ; Peters, C. J. ; Erickson, L. E.
Pub. info.: Silicide thin films - fabrication, properties, and applications : Symposium held November 27-30, 1995, Boston, Massachusetts, USA.  pp.59-,  1996.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 402